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Energy Dispersion X-ray Fluorescence Spectrometer(XRF)

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Energy Dispersion X-ray Fluorescence Spectrometer(XRF)

$19,980.00

SKU: 3532219018651 Category:

Description

Basic principle of XRF analysis
The electron orbital potential energy of the various elements is different from each other excitation is different from each other,i.e.,each element emits x-rays with the specific energy of the atom of that element,which represents the characteristics of the element and is therefore called the characteristic X-ray of the element. The characteristic X-ray of each element has its specific energy, and the X-ray detected with certain energy can determine the existence of this element in the material sample.

Applications widely

Electronics, plastics, metal materials: various electronic components, hardware, plastic materials and products, circuit board etc. Paper and paper materials: raw materials, various paper, toner, ink, etc. Petroleum, coal: petroleum, lubricating oil, heavy oil, polymer, coal, coke, etc.

Ceramics, cement: ceramics, refractory materials, rocks, glass, cement, cement raw materials and raw materials, clinker, limestone, clay, etc. Agriculture, food: soil, pesticide residues, fertilizer, plants, various food and so on.
Non-ferrous metals: copper alloys, aluminum alloys, lead alloys, zinc alloys, magnesium alloys, titanium alloys, precious metals, etc. lron and steel: pig iron, cast iron, stainless steel, low alloy steel, high alloy steel, special steel, ferroalloy, iron ore, slag, electroplating solution, casting sand, etc Chemical industry: inorganic organics and products, cosmetics, detergents, rubber, toners, catalysts, coatings, pigments, drugs, chemical fibers, etc. Environment: all kinds of waste, industrial waste, atmospheric dust, industrial waste water, sea water, river water, etc. Biological science: organisms. auxiliaries, etc.

Main component and technial parameters

● The detection limit of harmful elements Cd, Pd, Cr, Hg and Br is restricted according to ROHS instruction
Detection limit (Cd, Pd, Cr, Hg, Br): 2ppm

Si(PIN) or SDD detector The resolution of detector is one of the main indexes to evaluate the performance of energy dispersive XRF spectrometer. Resolution< 145eV (The lower the resolution, the higher the sensitivity.)

Counting rate >1000/S Crystal area > 15m㎡ Beryllium window thickness = 0.025mm
Detector power< 1.2W
Multi-channel analyzer Number of channels: 2048 channels
Power controller System power control: +5 VDC at 250 mA(1.2 W)
Constant cooling control: 400 VDC
X ray tube The X-ray tube, specially treated with embedded lead inside is shielded in full range, leaving only the side window for the x ray outlet. The canned insulating oil is used for high voltage insulation and cooling, 0.005 inch Beryllium window,rated consumption power 50W, rated power 50kV. Designed service life >15000h.
High voltage generator Input: 85 ~ 265VAC, 47 ~ 63Hz, Power factor correction.1kV ~ 5kV comply to UL85 ~250VAC input standard Voltage variation: 0.01% of output voltage from no load to full load
Current variation: 0 ~rated power, 0.01% of output current Ripple: Peak – peak of output voltage 0.25% Temperature variation:voltage or current setting, 0.01%/oC
Stability: 0.05%/8h after warming-up for half an hour

Technical parameters

Model

Al – NP – 5010A
Anylysis principle

Energy dispersive X-ray fluorescence analysis
Element measuring range

Any element from Na(11)~U(92)
Min. measuring limit

Cd/Hg/Br/Cr/Pb ≤ 2ppm
Sample shape

Arbitrary size, any irregular shape
Sanple type

Plastic/metal/film/powder/liquid etc
X ray tube

Target material

Mo
Tube voltage

5-50KV
Tube current

1-1000μA
Sample exposure diameter

2, 5, 8mm
Detector

Si-PIN or SDD detector, high speed pulse height analysis system
High voltage generator

Special HV genetator for X fluorescence
ADC

2048 channels
Filter

6filters are automatically selected and converted
Sample observation

200 * color CCD camera
Analysis software

Patented software products, free upgrade for life
Analysis method

Theoretical α coefficient method, basic parameter method, empirical coefficient method
Analysis time

30-900 seconds, adjustable
Operating system software

WINDOWS XP
Data processing system

Host

PC business model
CPU

≥ 2.8G
Memory

≥ 2G
CD-ROM

8*DVD
Hard disk

≥ 500G
Display

22″ or 24″ LCD display
Working enviroment

Temperature 10-35 ℃, humidity 30-90% RH